Shenvi VV, Sharma A. Integrating Manufacturing Intelligence, Computer Vision, and Process Observation for Yield Improvement and Failure Prediction in Electronics Manufacturing. RIMA [Internet]. 19Jun.2025 [cited 1Jul.2025];4(1):200-18. Available from: https://www.syncsci.com/journal/RIMA/article/view/RIMA.2025.01.007